Positron Annihilation in Semiconductors
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Produktnummer:
9783540643715
The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.
| Autor: | Krause-Rehberg, Reinhard Leipner, Hartmut S. |
|---|---|
| EAN: | 9783540643715 |
| Sprache: | Englisch |
| Seitenzahl: | 383 |
| Produktart: | Gebunden |
| Verlag: | Springer Springer, Berlin Springer Berlin Heidelberg |
| Untertitel: | Defect Studies |
| Schlagworte: | Halbleiterphysik Positronen |
| Gewicht: | 676 g |
