Scanning Probe Microscopy
355,00 €*
Sofort verfügbar, Lieferzeit: 1-3 Tage
Produktnummer:
9780387286679
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
| Autor: | Kalinin, Sergei V. Gruverman, Alexei |
|---|---|
| EAN: | 9780387286679 |
| Sprache: | Englisch |
| Seitenzahl: | 980 |
| Produktart: | Gebunden |
| Verlag: | Springer Springer, Berlin Springer New York |
| Untertitel: | Electrical and Electromechanical Phenomena at the Nanoscale |
| Schlagworte: | Elektromechanik Mikroskopie |
| Größe: | 235 |
| Gewicht: | 1984 g |
