Scanning Electron Microscopy
390,00 €*
Sofort verfügbar, Lieferzeit: 1-3 Tage
Produktnummer:
9783540639763
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| Autor: | Reimer, Ludwig |
|---|---|
| EAN: | 9783540639763 |
| Sprache: | Englisch |
| Seitenzahl: | 529 |
| Produktart: | Gebunden |
| Herausgeber: | Hawkes, P.W. |
| Verlag: | Springer Springer, Berlin Springer Berlin Heidelberg |
| Untertitel: | Physics of Image Formation and Microanalysis |
| Schlagworte: | Rasterelektronenmikroskopie |
| Größe: | 36 × 156 × 243 |
| Gewicht: | 981 g |
