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Investigation on Schottky-Barrier MOSFETs for Memory Application

Sung-Jin Choi, Yang-Kyu Choi
The structure of Schottky-barrier (SB) MOSFETs was investigated for both the perspective of practical applications and interest in novel Flash memory. We demonstrated how the source-side injection of hot electrons in the dopant-segregated SB (DSSB) Flash memory cell achieves high-speed, low-voltage programming with excellent injection efficiency, and no constraints on the optimization of gate and drain voltages. Moreover, the drain disturbance-free phenomenon in NOR Flash architecture was achieved. Excellent programming efficiency, especially, was achieved in a DSSB Flash device with a narrow fin width due to an enhanced lateral electric field without any sacrifice of parasitic resistance. Thus, the DSSB device can be a promising candidate in NOR Flash memory for attaining a lower programming voltage and power consumption.
Autor: Choi, Sung-Jin Choi, Yang-Kyu
EAN: 9783843377478
Sprache: Englisch
Seitenzahl: 100
Produktart: kartoniert, broschiert
Verlag: LAP Lambert Academic Publishing
Untertitel: Schottky-Barrier Flash Memory
Schlagworte: MOSFET (MOS-Feldeffekt-Transistor)