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Modern X-Ray Analysis on Single Crystals

Peter Luger
An excellent book for professional crystallographers! In 2012 the crystallographic community celebrated 100 years of X-ray diffraction in honour of the pioneering experiment in 1912 by Max von Laue, Friedrich and Knipping. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. This completely revised edition is a guide for practical work in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Emphasis is placed on understanding results and avoiding pitfalls. Essential reading for researchers from the student to the professional level interested in understanding the structure of molecules.
Autor: Luger, Peter
EAN: 9783110308235
Sprache: Englisch
Seitenzahl: 334
Produktart: Gebunden
Verlag: De Gruyter
Veröffentlichungsdatum: 31.03.2014
Untertitel: A Practical Guide
Schlagworte: Röntgenkristallographie
Größe: 245 × 172 × 20
Gewicht: 786 g