X-Ray Diffraction for Materials Research
202,00 €*
Sofort verfügbar, Lieferzeit: 1-3 Tage
Produktnummer:
9781771882989
This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how
| Autor: | Lee, Myeongkyu |
|---|---|
| EAN: | 9781771882989 |
| Sprache: | Englisch |
| Seitenzahl: | 302 |
| Produktart: | Gebunden |
| Verlag: | Apple Academic Press |
| Veröffentlichungsdatum: | 11.02.2016 |
| Untertitel: | From Fundamentals to Applications |
| Schlagworte: | Science |
| Größe: | 23 × 155 × 231 |
| Gewicht: | 540 g |
