Applied Scanning Probe Methods I. Vol.1
179,00 €*
Sofort verfügbar, Lieferzeit: 1-3 Tage
Produktnummer:
9783540005278
This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
| EAN: | 9783540005278 |
|---|---|
| Sprache: | Englisch |
| Seitenzahl: | 476 |
| Produktart: | Gebunden |
| Herausgeber: | Bhushan, Bharat Fuchs, Harald Hosaka, Sumio |
| Verlag: | Springer Springer, Berlin Springer Berlin Heidelberg |
| Schlagworte: | Abtastung (Technik) Nanotechnologie Rasterelektronenmikroskopie |
| Größe: | 235 |
| Gewicht: | 838 g |
