Surface and Thin Film Analysis
206,00 €*
Sofort verfügbar, Lieferzeit: 1-3 Tage
Produktnummer:
9783527320479
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
| EAN: | 9783527320479 |
|---|---|
| Sprache: | Englisch |
| Seitenzahl: | 534 |
| Produktart: | Gebunden |
| Herausgeber: | Friedbacher, Gernot Bubert, Henning |
| Verlag: | Wiley-VCH |
| Veröffentlichungsdatum: | 02.05.2011 |
| Untertitel: | A Compendium of Principles, Instrumentation, and Applications |
| Schlagworte: | Dünnschichttechnologie Oberflächenanalyse Analytische Chemie Spektroskopie Werkstoffprüfung Oberfläche |
| Größe: | 247 × 176 × 30 |
| Gewicht: | 1194 g |
